GENEVA, March 31 -- TEL MANUFACTURING AND ENGINEERING OF AMERICA, INC. (3455 Lyman Blvd.Chaska, Minnesota 55318) filed a patent application (PCT/US2025/041944) for "STITCHING DEFECT REDUCTION USING GAS CLUSTER BEAM" on Aug 14, 2025. With publication no. WO/2026/064038, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIU, Eric Chih-Fang (NanoFab 300 South, 255 Fuller Rd.Suite 214Albany, New York 12203), KO, Akiteru (NanoFab 300 South, 255 Fuller Rd.Suite 214Albany, New York 12203)

Abstract: A method of processing a substr...