GENEVA, April 18 -- TECHNOPROBE S.P.A. (Via Cavalieri di Vittorio Veneto, 223870 Cernusco Lombardone (LC)) filed a patent application (PCT/EP2025/079009) for "MEASUREMENT SYSTEM PROVIDED WITH MEANS FOR MEASURING A DISTANCE FROM THE SEMICONDUCTOR WAFER" on Oct 08, 2025. With publication no. WO/2026/078079, the details related to the patent application was published on Apr 16, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): APPELLO, Davide (c/o TECHNOPROBE S.p.A.Via Cavalieri di Vittorio Veneto, 223870 Cernusco Lombardone (LC)), VETTORI, Riccardo (c/o TECHNOPROBE S.p.A.Via Cavalieri di Vittori...