International Patent: SYSTEMS AND METHODS FOR IDENTIFYING WAFER VOLTAGE FROM INFLECTION POINTS

GENEVA, July 2 -- LAM RESEARCH CORPORATION filed a patent application (US2025/059719) for “SYSTEMS AND METHODS FOR IDENTIFYING WAFER VOLTAGE FROM INFLECTION POINTS”. With publication no. WO/2026/136278, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 31/28

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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