GENEVA, Sept. 24 -- ORBOTECH LTD. filed a patent application (IB2026/052659) for “SYSTEM AND METHOD FOR TRANSPARENT LAYER COMPENSATION IN 3D OPTICAL METROLOGY”. With publication no. WO/2026/196214, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01B 9/02002
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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