INTERNATIONAL PATENT: SYNSPECTIVE INC., 株式会社ＳＹＮＳＰＥＣＴＩＶＥ FILES APPLICATION FOR "ELEVATION ANALYSIS DEVICE AND ELEVATION ANALYSIS METHOD"

GENEVA, April 6 -- SYNSPECTIVE INC. (3-10-3, Miyoshi Koto-ku, Tokyo1350022), 株式会社Ｓｙｎｓｐｅｃｔｉｖｅ (東京都江東区三好３－１０－３) filed a patent application (PCT/JP2024/034171) for "ELEVATION ANALYSIS DEVICE AND ELEVATION ANALYSIS METHOD" on Sep 25, 2024. With publication no. WO/2026/069473, the details related to the patent application was published on Apr 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MOR...