International Patent: STATE DIAGNOSIS DEVICE, STATE DIAGNOSIS SYSTEM, STATE DIAGNOSIS METHOD, AND PROGRAM

GENEVA, Sept. 24 -- MITSUBISHI ELECTRIC CORPORATION filed a patent application (JP2025/022003) for “STATE DIAGNOSIS DEVICE, STATE DIAGNOSIS SYSTEM, STATE DIAGNOSIS METHOD, AND PROGRAM”. With publication no. WO/2026/196616, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: F04B 49/10

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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