GENEVA, May 4 -- SPECTX B.V. (Delftechpark 112628 XJ Delft) filed a patent application (PCT/EP2025/081039) for "AUTONOMOUS RADIOGRAPHY INSPECTION SYSTEM" on Oct 27, 2025. With publication no. WO/2026/087801, the details related to the patent application was published on Apr 30, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GOVEAS, Akhilesh Ignatius (Delftechpark 112628 XJ Delft), KAMALZADEH, Mani (Delftechpark 112628 XJ Delft), HAMEDANY, Ali Mahboob (Delftechpark 112628 XJ Delft)
Abstract: Method and systems for autonomous radiography inspection of a physical object are described wherein ...