International Patent: SILICON PHOTONICS WAFER TEST APPARATUS AND TEST METHOD THEREFOR, AND SILICON PHOTONICS WAFER TEST SYSTEM

GENEVA, July 9 -- SEMIGHT INSTRUMENTS CO., LTD. filed a patent application (CN2025/105747) for “SILICON PHOTONICS WAFER TEST APPARATUS AND TEST METHOD THEREFOR, AND SILICON PHOTONICS WAFER TEST SYSTEM”. With publication no. WO/2026/144065, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01M 11/02

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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