INTERNATIONAL PATENT: SIEMENS HEALTHCARE DIAGNOSTICS INC. FILES APPLICATION FOR "SAMPLE ANALYZER SYSTEM AND METHOD FOR DETERMINING SAMPLE INTEGRITY"

GENEVA, Feb. 4 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict AvenueTarrytown, New York 10591) filed a patent application (PCT/US2025/038812) for "SAMPLE ANALYZER SYSTEM AND METHOD FOR DETERMINING SAMPLE INTEGRITY" on Jul 23, 2025. With publication no. WO/2026/024814, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHERNYKH, Alexander M. (87 Upney DrOttawa, Ontario K2J 5G6), BASTIAND, Yves (28 Harrison StNepean, Ontario K2H 7N6), RAO, Srinivas Rao Arjun (1435 Prince of Wales Dr., Unit 218Ottawa, Ontario K2C 1N5)

Ab...