INTERNATIONAL PATENT: SIEMENS HEALTHCARE DIAGNOSTICS INC. FILES APPLICATION FOR "METHODS AND APPARATUS FOR INSPECTING A SAMPLE WITHIN A SAMPLE CONTAINER"

GENEVA, Dec. 2 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict AvenueTarrytown, New York 10591) filed a patent application (PCT/US2025/030687) for "METHODS AND APPARATUS FOR INSPECTING A SAMPLE WITHIN A SAMPLE CONTAINER" on May 22, 2025. With publication no. WO/2025/245406, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RENTSCHLER, Peter (Einsteinstrasse 13181675 Munchen), DUDECK, Sven Gerhard (Adlerweg 685551 Kirchheim b. Munchen)

Abstract: In some embodiments, an optical inspection system includes a sample contai...