GENEVA, Dec. 2 -- SIEMENS HEALTHCARE DIAGNOSTICS INC. (511 Benedict Ave.Tarrytown, New York 10591) filed a patent application (PCT/US2025/028627) for "METHODS AND APPARATUS FOR CLEANING SAMPLE ANALYZER COMPONENTS" on May 09, 2025. With publication no. WO/2025/244860, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): THOMPSON, David (500 GBC DriveNewark, DE 19702)

Abstract: In some embodiments, an apparatus configured to clean a portion of a sample analyzer is provided. The apparatus includes a flush cartridge including: a ...