GENEVA, July 29 -- SHISEIDO COMPANY, LTD. (5-5, Ginza 7-chome, Chuo-ku, Tokyo1040061), 株式会社資生堂 (東京都中央区銀座７丁目５番５号) filed a patent application (PCT/JP2024/046359) for "METHOD FOR EVALUATING CONDITION OF SKIN, AND SCREENING METHOD" on Dec 27, 2024. With publication no. WO/2025/154546, the details related to the patent application was published on Jul 24, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): INOUE, Daigo (c/o SHISEIDO COMPANY, LTD., 5...