INTERNATIONAL PATENT: SHANGHAI NUOXINBAISHI MEDICAL LABORATORY CO., LTD, 上海信诺佰世医学检验有限公司 FILES APPLICATION FOR "HIGH-THROUGHPUT TRANSCRIPTOME SEQUENCING-BASED IKZF1 GENE EXON DELETION RECOGNITION SYSTEM AND METHOD"

GENEVA, March 8 -- SHANGHAI NUOXINBAISHI MEDICAL LABORATORY CO., LTD (3-4 Floor, Building 5, No. 2555 Xiupu RoadPudong New Area, Shanghai 200000), 上海信诺佰世医学检验有限公司 (中国上海市浦东新区秀浦路2555号5幢3-4楼) filed a patent application (PCT/CN2025/098667) for "HIGH-THROUGHPUT TRANSCRIPTOME SEQUENCING-BASED IKZF1 GENE EXON DELETION RECOGNITION SYSTEM AND METHOD" on May 30, 2025. With publication no. WO/2026/045448, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the International Pa...