International Patent: SEMICONDUCTOR TEST APPARATUS INCLUDING MULTIPLE PROBE PINS

GENEVA, June 24 -- OKINS ELECTRONICS CO.,LTD filed a patent application (KR2025/012726) for “SEMICONDUCTOR TEST APPARATUS INCLUDING MULTIPLE PROBE PINS”. With publication no. WO/2026/116689, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 1/073

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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