GENEVA, Aug. 7 -- HITACHI HIGH-TECH CORPORATION filed a patent application (JP2025/002921) for “SEMICONDUCTOR INSPECTION DEVICE, ELECTRICAL CHARACTERISTIC INSPECTION DEVICE, AND ELECTRICAL CHARACTERISTIC INSPECTION METHOD”. With publication no. WO/2026/163322, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H01L 21/66
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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