GENEVA, Oct. 30 -- YANGTZE MEMORY TECHNOLOGIES CO., LTD. filed a patent application (CN2025/091123) for “SEMICONDUCTOR DEVICE AND METHOD FOR DETECTING ALIGNMENT ACCURACY IN THE SEMICONDUCTOR DEVICE”. With publication no. WO/2026/222769, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G11C 29/50
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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