International Patent: SELF-TEST METHOD, INTEGRATED CIRCUIT, CHIP, SENSOR, AND DEVICE

GENEVA, July 6 -- CALTERAH SEMICONDUCTOR TECHNOLOGY (SHANGHAI) CO., LTD. filed a patent application (CN2025/145588) for “SELF-TEST METHOD, INTEGRATED CIRCUIT, CHIP, SENSOR, AND DEVICE”. With publication no. WO/2026/138961, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 11/22

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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