INTERNATIONAL PATENT: SEE ALL AI INC. FILES APPLICATION FOR "MULTI-REFERENCE MARKER FRAMEWORK FOR ENHANCED SURGICAL NAVIGATION"

GENEVA, March 11 -- SEE ALL AI INC. (39 Technology WaySuite 3W1Nashua, New Hampshire 03060) filed a patent application (PCT/US2025/028652) for "MULTI-REFERENCE MARKER FRAMEWORK FOR ENHANCED SURGICAL NAVIGATION" on May 09, 2025. With publication no. WO/2026/049814, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GREGERSON, Eugene Alma (686 Country CourtNorth Salt Lake, Utah 84054), MAJOR, Eric David (38253 North Ford RoadPurcellville, Virginia 20132)

Abstract: A system and method combines optical and radiographic data to ...