INTERNATIONAL PATENT: SCHNEIDER, ADRIAN FILES APPLICATION FOR "METHOD AND SYSTEM FOR TOTAL INTERNAL REFLECTION MICROSCOPY IMAGING OF LARGE SAMPLES"

GENEVA, Feb. 9 -- SCHNEIDER, Adrian (Beethovenstr. 7614513 Teltow) filed a patent application (PCT/EP2025/071946) for "METHOD AND SYSTEM FOR TOTAL INTERNAL REFLECTION MICROSCOPY IMAGING OF LARGE SAMPLES" on Jul 30, 2025. With publication no. WO/2026/027620, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SCHNEIDER, Adrian (Beethovenstr. 7614513 Teltow)

Abstract: A method for total internal reflection microscopy imaging of a sample and a system for total internal reflection microscopy imaging to carry out the method steps...