INTERNATIONAL PATENT: SANDISK TECHNOLOGIES, INC. FILES APPLICATION FOR "APPARATUS AND METHODS FOR DETECTING COUPLING FAULTS IN NON-VOLATILE MEMORY DEVICES"

GENEVA, Feb. 4 -- SANDISK TECHNOLOGIES, INC. (951 Sandisk DriveMilpitas, California 95035) filed a patent application (PCT/US2025/025663) for "APPARATUS AND METHODS FOR DETECTING COUPLING FAULTS IN NON-VOLATILE MEMORY DEVICES" on Apr 22, 2025. With publication no. WO/2026/024335, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHU, Xiaochen (c/o Sandisk Technologies, Inc.951 Sandisk DriveMilpitas, California 95035)

Abstract: An apparatus is provided that includes a memory die including non-volatile memory cells coupled t...