INTERNATIONAL PATENT: SAFRAN FILES APPLICATION FOR "METHOD FOR DETECTING A DEFECT ON A METAL PART"

GENEVA, April 13 -- SAFRAN (2 Boulevard Du General Martial Valin75015 PARIS) filed a patent application (PCT/FR2025/050862) for "METHOD FOR DETECTING A DEFECT ON A METAL PART" on Sep 23, 2025. With publication no. WO/2026/074240, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MARINO, Sofia (SAFRANc/o Centre d'Excellence Propriete IntellectuelleRond-point Rene Ravaud, Reau77550 MOISSY-CRAMAYEL), BENAICHOUCHE, Ahmed Nasreddine (SAFRANc/o Centre d'Excellence Propriete IntellectuelleRond-point Rene Ravaud, Reau77550 MOISSY-C...