International Patent: REGRESSION ANALYSIS-BASED CIRCUIT CHARACTERISTIC OPTIMIZATION DEVICE AND METHOD FOR DIGITAL CIRCUIT DESIGN

GENEVA, July 6 -- KWANGWOON UNIVERSITY INDUSTRY-ACADEMIC COLLABORATION FOUNDATION filed a patent application (KR2024/021031) for “REGRESSION ANALYSIS-BASED CIRCUIT CHARACTERISTIC OPTIMIZATION DEVICE AND METHOD FOR DIGITAL CIRCUIT DESIGN”. With publication no. WO/2026/141715, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 30/337

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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