INTERNATIONAL PATENT: REFINED LASER SYSTEMS GMBH FILES APPLICATION FOR "MICROSCOPY SYSTEM AND A METHOD OF MICROSCOPY FOR ANALYSING A SAMPLE"

GENEVA, March 2 -- REFINED LASER SYSTEMS GMBH (MendelstraBe 1148149 Munster) filed a patent application (PCT/EP2025/073962) for "MICROSCOPY SYSTEM AND A METHOD OF MICROSCOPY FOR ANALYSING A SAMPLE" on Aug 22, 2025. With publication no. WO/2026/041772, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HELLWIG, Tim (Mathilde-Anneke-Weg 448147 Munster), LUPKEN, Niklas (Wilhelmstr. 3448149 Munster), BRINKMANN, Maximilian (Mondstr. 21148149 Munster)

Abstract: A microscopy system (1) is provided for imaging a sample. The microsc...