International Patent: PRODUCT DEFECT RATE PREDICTION METHOD AND SYSTEM

GENEVA, July 6 -- DELTA ELECTRONICS, INC. filed a patent application (CN2024/142294) for “PRODUCT DEFECT RATE PREDICTION METHOD AND SYSTEM”. With publication no. WO/2026/137242, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 18/214

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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