International Patent: ORGANIC DEFECT SOURCE IDENTIFICATION USING ARTIFICIAL INTELLIGENCE

GENEVA, July 31 -- APPLIED MATERIALS, INC. filed a patent application (US2025/050580) for “ORGANIC DEFECT SOURCE IDENTIFICATION USING ARTIFICIAL INTELLIGENCE”. With publication no. WO/2026/161118, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06T 7/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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