INTERNATIONAL PATENT: ORBOTECH LTD FILES APPLICATION FOR "SYSTEMS AND METHODS FOR INSPECTION AND METROLOGY OF VERTICAL INTERCONNECT ACCESS IN SEMICONDUCTOR SUBSTRATES"

GENEVA, April 13 -- ORBOTECH LTD (Shderot Hasanhedrin 78110101 Yavne) filed a patent application (PCT/IB2025/059118) for "SYSTEMS AND METHODS FOR INSPECTION AND METROLOGY OF VERTICAL INTERCONNECT ACCESS IN SEMICONDUCTOR SUBSTRATES" on Sep 11, 2025. With publication no. WO/2026/074352, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TURKO, Nir (Prof. Yehudit Birk 47608640 Rehovot), LINDEN, John (Yahalom 10/47173728 Modiin), ROSENBERG, Boaz (13 Hagoren Street70700 Gadera), SALTOUN-RAZ, Lilach (Hadror 35560002 Qiriat Ono)

A...