International Patent: OPTICAL WAVEFORM MEASUREMENT DEVICE, LIGHT IRRADIATION DEVICE, LASER PROCESSING DEVICE, OBSERVATION DEVICE, OPTICAL WAVEFORM MEASUREMENT METHOD, LIGHT IRRADIATION METHOD, LASER PROCESSING METHOD, AND OBSERVATION METHOD

GENEVA, July 6 -- HAMAMATSU PHOTONICS K.K. filed a patent application (JP2025/041410) for “OPTICAL WAVEFORM MEASUREMENT DEVICE, LIGHT IRRADIATION DEVICE, LASER PROCESSING DEVICE, OBSERVATION DEVICE, OPTICAL WAVEFORM MEASUREMENT METHOD, LIGHT IRRADIATION METHOD, LASER PROCESSING METHOD, AND OBSERVATION METHOD”. With publication no. WO/2026/140666, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01J 11/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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