GENEVA, July 1 -- HUAWEI TECHNOLOGIES CO., LTD. filed a patent application (CN2025/105844) for “OBJECT DEFORMATION DETECTION METHOD AND APPARATUS, AND SYSTEM”. With publication no. WO/2026/045637, here are the other details related to the patent application:

Kind: Corrected version of pamphlet [A9]

IPC: G01B 21/32

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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