International Patent: NUMERICAL APERTURE SAMPLER FOR OPTICAL METROLOGY TOOL CALIBRATION

GENEVA, Oct. 5 -- NOVA LTD. filed a patent application (IB2026/052918) for “NUMERICAL APERTURE SAMPLER FOR OPTICAL METROLOGY TOOL CALIBRATION”. With publication no. WO/2026/202782, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 21/27

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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