GENEVA, July 8 -- NOVA LTD. (5 David Fikes St.,7610201 Rehovot), INTERNATIONAL BUSINESS MACHINES CORPORATION (IBM) (1 Orchard Rd,Armonk, New York 10504) filed a patent application (PCT/IL2024/051238) for "VERTICALLY-RESOLVED METROLOGY WITH ASYMMETRY-SENSITIVE MEASUREMENT" on Dec 30, 2024. With publication no. WO/2025/141587, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SCHOECHE, Stefan (308 Sandidge Way,Albany, New York 12203), SCHMIDT, Daniel (52 Empire Dr.,Niskayuna, New York 12309), CHENG, Marjorie (c/o Nova Ltd. 5 ...