INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "METHODS FOR LAYER 3 MEASUREMENTS BASED LAYER 1/LAYER2 TRIGGERED MOBILITY CROSS-REFERENCE TO RELATED APPLICATIONS"

GENEVA, Feb. 16 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/069437) for "METHODS FOR LAYER 3 MEASUREMENTS BASED LAYER 1/LAYER2 TRIGGERED MOBILITY CROSS-REFERENCE TO RELATED APPLICATIONS" on Jul 08, 2025. With publication no. WO/2026/032594, the details related to the patent application was published on Feb 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DOSTI, Endrit (Nokia Solutions and Networks OyKarakaari 7Espoo Espoo), SELVAGANAPATHY, Srinivasan (Nokia Solutions and Networks India Private LimitedManyata Embassy Business ParkBangalore 56004...