INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "METHOD, APPARATUS AND COMPUTER PROGRAM FOR SELF-INTERFERENCE MEASUREMENT"

GENEVA, Jan. 5 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/062264) for "METHOD, APPARATUS AND COMPUTER PROGRAM FOR SELF-INTERFERENCE MEASUREMENT" on May 06, 2025. With publication no. WO/2026/002444, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NIELSEN, Kim (Nokia Denmark A/SAlfred Nobels Vej 279220 Aalborg), DHERE, Amol (Nokia Denmark A/SAlfred Nobels Vej 279220 Aalborg)

Abstract: There is provided a method, computer program, and apparatus for causing the apparatus to perf...