INTERNATIONAL PATENT: NOKIA TECHNOLOGIES OY FILES APPLICATION FOR "FRACTIONAL MEASUREMENT GAPS"

GENEVA, Oct. 13 -- NOKIA TECHNOLOGIES OY (Karakaari 702610 Espoo) filed a patent application (PCT/EP2025/057906) for "FRACTIONAL MEASUREMENT GAPS" on Mar 24, 2025. With publication no. WO/2025/209856, the details related to the patent application was published on Oct 09, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CAUDURO DIAS DE PAIVA, Rafael (c/o Nokia Denmark A/SAlfred Nobels Vej 279220 Aalborg), HARRIS, John (c/o Nokia of America Corporation600-700 Mountain Avenue,Murray Hill, New Jersey 07974-0636), PEDERSEN, Klaus Ingemann (c/o Nokia Denmark A/SAlfred Nobels Vej 279220 Aalborg), KA...