INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "OPTICAL MEASUREMENT DEVICE, OPTICAL SCANNING DEVICE AND ROTATION DEVICE"

GENEVA, Dec. 29 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2024/022626) for "OPTICAL MEASUREMENT DEVICE, OPTICAL SCANNING DEVICE, AND ROTATION DEVICE" on Jun 21, 2024. With publication no. WO/2025/262935, the details related to the patent application was published on Dec 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MIYAKAWA Tomoki (c/o NIKON CORPORA...