INTERNATIONAL PATENT: NIKON CORPORATION, 株式会社ニコン FILES APPLICATION FOR "MEASURING METHOD, MEASURING DEVICE AND PROCESSING SYSTEM"

GENEVA, July 29 -- NIKON CORPORATION (15-3, Konan 2-chome, Minato-ku, Tokyo1086290), 株式会社ニコン (東京都港区港南二丁目１５番３号) filed a patent application (PCT/JP2024/001507) for "MEASURING METHOD, MEASURING DEVICE, AND PROCESSING SYSTEM" on Jan 19, 2024. With publication no. WO/2025/154279, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NAKAGAWA, Tomoya (c/o NIKON CORPORATION, 15-3, Ko...