INTERNATIONAL PATENT: NEWPHOTONICS LTD. FILES APPLICATION FOR "WAFER AND CHIP LEVEL TESTING FOR PHOTONIC INTEGRATED CIRCUITS"

GENEVA, March 2 -- NEWPHOTONICS LTD. (65 HaPardes St.7685400 Kfar-Mordehai) filed a patent application (PCT/IL2025/050446) for "WAFER AND CHIP LEVEL TESTING FOR PHOTONIC INTEGRATED CIRCUITS" on May 25, 2025. With publication no. WO/2026/042062, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BEN-EZRA, Yosef (Itzhak Ben-Zvi 27/864902610 Petah Tikva), TAL, Doron (Hailanot 44691000 Kfar Shmaryahu), BEN-HAIM, Yaniv (HaPardes 657685400 Kfar-Mordehai)

Abstract: A wafer and testing methods for a chip, the wafer comprising: a pl...