INTERNATIONAL PATENT: NEW JERSEY INSTITUTE OF TECHNOLOGY FILES APPLICATION FOR "METHODS FOR THE DESTRUCTION AND MEASUREMENT OF PFAS"

GENEVA, Jan. 13 -- NEW JERSEY INSTITUTE OF TECHNOLOGY (323 Dr. Martin Luther King Jr. Blvd.University HeightsNewark, New Jersey 07102-1982) filed a patent application (PCT/US2025/036222) for "METHODS FOR THE DESTRUCTION AND MEASUREMENT OF PFAS" on Jul 02, 2025. With publication no. WO/2026/011034, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VENKATESAN, Arjunkrishna (113 Summerhill Dr.Morris Plains, New Jersey 07950)

Abstract: Disclosed is a process for the destruction of per- and polyfluoroalkyl substances (PFAS). Th...