INTERNATIONAL PATENT: NEC LABORATORIES AMERICA, INC. FILES APPLICATION FOR "MULTI-MODALITY ANOMALY DETECTION USING FUSED MODELS"

GENEVA, April 14 -- NEC LABORATORIES AMERICA, INC. (4 Independence WaySuite 200Princeton, New Jersey 08540) filed a patent application (PCT/US2025/048104) for "MULTI-MODALITY ANOMALY DETECTION USING FUSED MODELS" on Sep 26, 2025. With publication no. WO/2026/075886, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WANG, Junxiang (6802 Ravens Crest DrivePlainsboro, New Jersey 08536), CHEN, Zhengzhang (44 York RoadPrinceton Junction, New Jersey 08550), CHEN, Haifeng (11 Blackhawk CourtWest Windsor, New Jersey 08550), ZHENG, ...