INTERNATIONAL PATENT: NEARFIELD INSTRUMENTS B.V. FILES APPLICATION FOR "SCANNING PROBE MICROSCOPY SYSTEM AND METHOD FOR MAPPING NANOSTRUCTURES ON A SAMPLE SURFACE OF A SAMPLE."

GENEVA, Jan. 13 -- NEARFIELD INSTRUMENTS B.V. (Vareseweg 53047 AT Rotterdam) filed a patent application (PCT/NL2025/050330) for "SCANNING PROBE MICROSCOPY SYSTEM AND METHOD FOR MAPPING NANOSTRUCTURES ON A SAMPLE SURFACE OF A SAMPLE." on Jul 02, 2025. With publication no. WO/2026/010502, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GEZER, Gurol (c/o Vareseweg 53047 AT Rotterdam)

Abstract: The invention is directed at a scanning probe microscopy system and method for mapping nanostructures on a sample surface. The syste...