INTERNATIONAL PATENT: NATIONAL INSTITUTE OF METROLOGY OF CHINA, 中国计量科学研究院 FILES APPLICATION FOR "DIGITAL CALIBRATION CERTIFICATE GENERATION AND VERIFICATION METHOD AND SYSTEM BASED ON MICRO-SERVICE ARCHITECTURE"

GENEVA, Nov. 2 -- NATIONAL INSTITUTE OF METROLOGY OF CHINA (18 North Third Ring East RoadChaoyang District, Beijing 100029), 中国计量科学研究院 (中国北京市朝阳区北三环东路18号) filed a patent application (PCT/CN2024/093791) for "DIGITAL CALIBRATION CERTIFICATE GENERATION AND VERIFICATION METHOD AND SYSTEM BASED ON MICRO-SERVICE ARCHITECTURE" on May 17, 2024. With publication no. WO/2025/222567, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World ...