INTERNATIONAL PATENT: NATIONAL INSTITUTE OF METROLOGY, CHINA, 中国计量科学研究院 FILES APPLICATION FOR "ACTIVE ANALOG STANDARD INDUCTOR AND VALUE SETTING METHOD THEREFOR"

GENEVA, Jan. 4 -- NATIONAL INSTITUTE OF METROLOGY, CHINA (No.18, Bei San Huang Dong LuChaoyang District, Beijing 100029), 中国计量科学研究院 (中国北京市朝阳区北三环东路18号) filed a patent application (PCT/CN2025/102896) for "ACTIVE ANALOG STANDARD INDUCTOR AND VALUE SETTING METHOD THEREFOR" on Jun 24, 2025. With publication no. WO/2026/001919, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Invento...