GENEVA, Jan. 27 -- MURATA MANUFACTURING CO., LTD. (10-1, Higashikotari 1-chome, Nagaokakyo-shi, Kyoto6178555), 株式会社村田製作所 (京都府長岡京市東神足１丁目１０番１号) filed a patent application (PCT/JP2025/019860) for "DEFECT DETECTION METHOD AND METHOD FOR MANUFACTURING MULTILAYER CERAMIC ELECTRONIC COMPONENT INCLUDING SAME" on Jun 02, 2025. With publication no. WO/2026/018582, the details related to the patent application was published on Jan 22, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by ...