GENEVA, April 14 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都千代田区丸の内二丁目７番３号) filed a patent application (PCT/JP2025/028793) for "SEMICONDUCTOR ELEMENT TESTING DEVICE, METHOD FOR EVALUATING SEMICONDUCTOR ELEMENT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE" on Aug 15, 2025. With publication no. WO/2026/074815, the details related to the patent application was published on Apr 09, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed ...