GENEVA, March 10 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都千代田区丸の内二丁目７番３号) filed a patent application (PCT/JP2024/031046) for "QUALITY ANALYSIS DISPLAY DEVICE, ADDITIVE MANUFACTURING SYSTEM, QUALITY ANALYSIS DISPLAY METHOD, AND QUALITY ANALYSIS DISPLAY PROGRAM" on Aug 29, 2024. With publication no. WO/2026/047955, the details related to the patent application was published on Mar 05, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed...