International Patent: MICRORNA SIGNATURE FOR THE EARLY DIAGNOSIS OF LOCALIZED RADIATION-INDUCED LESIONS

GENEVA, July 2 -- ETAT FRANÇAIS REPRÉSENTÉ PAR LE PRÉSIDENT DE L’AUTORITÉ DE SÛRETÉ NUCLÉAIRE ET DE RADIOPROTECTION filed a patent application (EP2025/086699) for “MICRORNA SIGNATURE FOR THE EARLY DIAGNOSIS OF LOCALIZED RADIATION-INDUCED LESIONS”. With publication no. WO/2026/131471, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: C12Q 1/6886

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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