INTERNATIONAL PATENT: MICRONICS JAPAN CO., LTD., 株式会社日本マイクロニクス FILES APPLICATION FOR "PROBE CARD AND METHOD FOR MANUFACTURING PROBE CARD"

GENEVA, March 17 -- MICRONICS JAPAN CO., LTD. (2-6-8, Kichijoji Hon-cho, Musashino-shi, Tokyo1808508), 株式会社日本マイクロニクス (東京都武蔵野市吉祥寺本町２丁目６番８号) filed a patent application (PCT/JP2025/024381) for "PROBE CARD AND METHOD FOR MANUFACTURING PROBE CARD" on Jul 07, 2025. With publication no. WO/2026/053575, the details related to the patent application was published on Mar 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Pr...