INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "MEMORY SUB-SYSTEM INITIATED BURST SCAN UNDER LOW POWER MODE"

GENEVA, March 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/044071) for "MEMORY SUB-SYSTEM INITIATED BURST SCAN UNDER LOW POWER MODE" on Aug 28, 2025. With publication no. WO/2026/050577, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHENG, Chao-Han (1521 Marcia AvenueSan Jose, California 95125), ZHANG, Lei (7 Upper Bukit Timah View, #06-01,Bukit Timah 588135), KUNDURU, Srinivasa Reddy (13-05, Block-601, Senja RoadBukit Panjang 670601)

Abstract: A wake u...