INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "MEMORY SUB-SYSTEM FOR BLOCK STRIPE SELECTION AND TESTING"

GENEVA, Feb. 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/039757) for "MEMORY SUB-SYSTEM FOR BLOCK STRIPE SELECTION AND TESTING" on Jul 29, 2025. With publication no. WO/2026/030383, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LI, Juane (1998 Bright Willow CircleSan Jose, California 95131), NARUM, Steven (3389 West Muirfield DriveMeridian, Idaho 83646)

Abstract: Various aspects of the present disclosure relate to a memory sub-system for block stripe s...