INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "DYNAMIC READ DISTURB HANDLING USING SELECTIVE SCANNING"

GENEVA, Jan. 27 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/037944) for "DYNAMIC READ DISTURB HANDLING USING SELECTIVE SCANNING" on Jul 16, 2025. With publication no. WO/2026/019949, the details related to the patent application was published on Jan 22, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIN, Lei (3074 Dickens CourtFremont, California 94536), PAPAGIANNI, Christina (7088 Martwood WaySan Jose, California 95120), HU, Guang (1200 Dale Avenue #145Mountain View, California 94040), LANG, Murong (1381 Bing DriveSan Jose, C...