INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "DETERMINING A GROWN BAD BLOCK ALLOWANCE ASSOCIATED WITH A MEMORY DEVICE"

GENEVA, Feb. 11 -- MICRON TECHNOLOGY, INC. (8000 South Federal WayBoise, Idaho 83716) filed a patent application (PCT/US2025/039962) for "DETERMINING A GROWN BAD BLOCK ALLOWANCE ASSOCIATED WITH A MEMORY DEVICE" on Jul 30, 2025. With publication no. WO/2026/030498, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIU, Yang (1310 Birchwood LaneMelissa, California 75454), WU, Fanqi (716 Peach AvenueSunnyvale, California 94087), LEE, Aaron (826 Quetta AvenueSunnyvale, California 94087)

Abstract: A processing device determines...